High-density, visible LED's production test
fecha:2011-06-08 11:33
estado:para resolver
pregunta:admin
nt of light intensity.
Figure 3a: LED measurement circuit
Figure 3b: photodetector power supply circuit
Multi / Array LED System
For the LED array, multi-die package or aging test application, we often need to simultaneously test a lot of LED. A test multiple devices in the most cost effective way to integrate test system switch. Aging test is usually to delay the need for power LED, which requires no dedicated power supply with a switch function. PD aging test system of measurement
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